Energy dispersive X-ray fluorescence analyzer configuration instructions

The basic working principle of the energy dispersive X-ray spectrometer (EDXRF) is to irradiate the sample with the primary scattered X-ray generated by the scattered X-ray tube, and the generated characteristic scattered X-ray (fluorescence) directly enters the SI (LI) detection Can be used for qualitative and theoretical analysis. It is possible to identify which elements are contained in the tested sample by detecting the characteristic X-rays of the elements and identifying their energy (the characteristic X-rays of each element have specific energy); and the intensity of the X-ray intensity with a certain energy is It is directly related to the element content of the fluorescent X-rays that can emit this energy in the tested sample. Measure the intensity of these spectral lines and perform corresponding data processing and calculations to obtain the various elements in the tested sample. content. Therefore, X-ray tube and detector are indispensable for energy dispersive X-ray spectrum analyzer. Taking HeLeeX E8 (universal type) as an example, the common configuration of energy dispersive X-ray spectrum analyzer is introduced.

E8 energy dispersive X-ray spectrum analyzer

Instrument hardware configuration

1. Detector

Type: Si-PIN detector (using original imported high-performance electric refrigeration semiconductor detector)

Be window thickness: 1mil

Crystal area: 25mm2

Best resolution: 149eV

Signal processing system DP5

Energy dispersive X-ray fluorescence analyzer configuration instructions

2. X-ray tube

Voltage: 0 ~ 50kV

Maximum current: 2.0mA

Maximum power: 50W

Target material: Mo

Be window thickness: 0.5mm

Service life: more than 20,000 hours

Energy dispersive X-ray fluorescence analyzer configuration instructions

3. High voltage power supply

Output voltage: 0 ~ 50kV

Filament current: 0 ~ 2mA

Maximum power: 50W

Ripple coefficient: 0.1% (pp value)

8-hour stability: 0.05%

Energy dispersive X-ray fluorescence analyzer configuration instructions

4. Camera

Micro focal length

Drive-free

500 million pixels

Energy dispersive X-ray fluorescence analyzer configuration instructions

5. Collimator and filter

Quick disassembly of collimator and filter system

Various material collimators

Spot size Φ0.7mm, Φ1.2mm, Φ3.0mm, Φ5.0mm

Various filter and collimator combinations, software automatically switches

6. Other accessories

Imported high-performance switching power supply

Imported low-noise, high-volume fan

Instrument peripheral configuration

1. Standard samples

One piece of imported ERM-EC681K

One piece of imported ERM-EC680K

Exquisite sterling silver correction film-film

A beautiful sample box

Two sample cups

2. Computer

Screen size: 18.5 inches

CPU model: AMD Athlon II X2 220

CPU frequency: 2800MHz

Memory capacity: 2GB DDR3 1066MHz

Hard disk capacity: 320GB 7200 rpm, SATA2

3. Printer

Color inkjet printer

The highest resolution: 4800x1200dpi

4. Other

One roll of special film for testing

2 pairs of gloves

Software configuration

Software name: HeLeeX ED Workstation V3.0.

Response directives: RoHS testing (Pb, Cd, Hg, Cr, Br), halogen-free testing (Br, Cl)

Open analysis model. A variety of data algorithms, according to different matrix samples, equipped with different algorithms to improve the accuracy of instrument testing.

One-click data backup and one-key restore to increase data security.

The operation interface is simple and easy to use.

Software help function.

software interface

Energy dispersive X-ray fluorescence analyzer configuration instructions

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